Scanning Electron Microscopy And X Ray Microanalysis

Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461502152
Size: 26.95 MB
Format: PDF, Kindle
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This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis.

Scanning Electron Microscopy And X Ray Microanalysis

Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461332737
Size: 35.83 MB
Format: PDF, ePub
View: 872
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This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975.

Practical Scanning Electron Microscopy

Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461344220
Size: 75.34 MB
Format: PDF
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In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States.

Scanning Microscopy For Nanotechnology

Author: Weilie Zhou
Publisher: Springer Science & Business Media
ISBN: 0387396209
Size: 60.81 MB
Format: PDF, ePub
View: 6615
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The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.