Scanning Electron Microscopy And X Ray Microanalysis

Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461502152
Size: 24.99 MB
Format: PDF, ePub, Mobi
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This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis.

Scanning Electron Microscopy And X Ray Microanalysis

Author: Joseph Goldstein
Publisher: Springer Science & Business Media
ISBN: 1461332737
Size: 27.41 MB
Format: PDF, Mobi
View: 2544
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This book has evolved by processes of selection and expansion from its predecessor, Practical Scanning Electron Microscopy (PSEM), published by Plenum Press in 1975.

Scanning Electron Microscopy And X Ray Microanalysis

Author: Joseph I. Goldstein
Publisher: Springer
ISBN: 1493966766
Size: 33.23 MB
Format: PDF, ePub
View: 1671
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However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal.