Transmission Electron Microscopy

Author: David B. Williams
Publisher: Springer Science & Business Media
ISBN: 0387765018
Size: 25.26 MB
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This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique.

Transmission Electron Microscopy

Author: C. Barry Carter
Publisher: Springer
ISBN: 3319266519
Size: 10.83 MB
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This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter.

Transmission Electron Microscopy

Author: David Bernard Williams
Publisher: Plenum Publishing Corporation
ISBN: 9780306453243
Size: 38.91 MB
Format: PDF, ePub, Docs
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This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.

Physical Principles Of Electron Microscopy

Author: Ray Egerton
Publisher: Springer Science & Business Media
ISBN: 9780387258003
Size: 63.48 MB
Format: PDF, Docs
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At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

Transmission Electron Microscopy

Author: David B. Williams
Publisher: Springer Science & Business Media
ISBN: 038776500X
Size: 70.82 MB
Format: PDF, ePub, Docs
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A Textbook for Materials Science David B. Williams, C. Barry Carter ... In real
space, we can define any lattice vector, rn, by the equation rn 1⁄4 n1a þ n2b þ n3c
(12:2) where the vectors a, b, and c are the unit-cell translations in real space and
n1, n2, and n3 are all integers. ... We define the lengths of these vectors by
another set of relations a* Á a1⁄4 1; b* Á b 1⁄4 1; c* Á c 1⁄4 1 (12:5) Equation 12.5
then uniquely defines the length of the vector a* in terms of the length of the
vector a.

Scanning Transmission Electron Microscopy

Author: Stephen J. Pennycook
Publisher: Springer Science & Business Media
ISBN: 9781441972002
Size: 34.41 MB
Format: PDF, ePub, Mobi
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Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity.

Advanced Computing In Electron Microscopy

Author: Earl J. Kirkland
Publisher: Springer Science & Business Media
ISBN: 9780306459368
Size: 12.70 MB
Format: PDF, Kindle
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This book attempts to bring the diverse information on image simulation together into one place and to provide a background on how to use the multislice method to simulate high resolution images in both conventional and scanning ...