Transmission Electron Microscopy

Author: C. Barry Carter
Publisher: Springer
ISBN: 3319266519
Size: 60.74 MB
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This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter.

Transmission Electron Microscopy

Author: David B. Williams
Publisher: Springer Science & Business Media
ISBN: 0387765018
Size: 50.63 MB
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This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique.

Scanning Transmission Electron Microscopy

Author: Stephen J. Pennycook
Publisher: Springer Science & Business Media
ISBN: 9781441972002
Size: 15.28 MB
Format: PDF
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Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity.

Aberration Corrected Analytical Transmission Electron Microscopy

Author: Rik Brydson
Publisher: John Wiley & Sons
ISBN: 1119979900
Size: 19.89 MB
Format: PDF, ePub, Mobi
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This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry ...

Electron Microscopy

Author: S. Amelinckx
Publisher: John Wiley & Sons
ISBN: 3527614559
Size: 60.52 MB
Format: PDF
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Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy.

Physical Principles Of Electron Microscopy

Author: Ray Egerton
Publisher: Springer Science & Business Media
ISBN: 9780387258003
Size: 40.83 MB
Format: PDF, ePub, Mobi
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At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

Scanning Electron Microscopy And X Ray Microanalysis

Author: Joseph I. Goldstein
Publisher: Springer
ISBN: 1493966766
Size: 61.76 MB
Format: PDF, ePub, Docs
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However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process. This book helps you to achieve this goal.

Scanning Electron Microscopy

Author: Ludwig Reimer
Publisher: Springer
ISBN: 3662135620
Size: 23.57 MB
Format: PDF, ePub
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The aim of this book is to outline the physics of image formation, electron specimen interactions, imaging modes, the interpretation of micrographs and the use of quantitative modes "in scanning electron microscopy (SEM). lt forms a ...